NEC infrared thermal imager, PCB acceleration sensor, high pixel infrared imager, dynamic data acquisition instrument, woodworking laboratory, PCB sensor, wire rope detector, handheld XRF spectrometer, infrared detection service, wire rope nondestructive testing, wire rope flaw detection service, wire rope lubricator, MIKRON blackbody calibration source, IMPAC infrared thermometer.
- American Piezoelectric PCB Sensor
- Data acquisition instrument
- stress-strain measurement
- infrared thermal imager
- Handheld XRF Spectrometer
- France CA Electrical Measurement
- Woodworking machinery and equipment
- 高校創(chuàng)意木工坊
- full-day blind ultraviolet imager
- Wire rope detector
- Blackbody calibration source
- Professional Testing Services
- X-ray residual stress tester
- spectrophotometer
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Opterro光纖測(cè)量系統(tǒng)
Application of X-ray Fluorescence Spectrometer in Soil Heavy Metal Detection in Tongji University
同濟(jì)大學(xué)環(huán)境科學(xué)系應(yīng)用X-MAT8000射線熒光光譜儀對(duì)土壤重金屬檢測(cè)
日立 X-MAT8000土壤/礦物成分篩選分析應(yīng)用概覽
日立X-MAT8000X射線熒光光譜儀土壤礦物配置包是牛津儀器專為環(huán)境研究推出的*新手持式X射線熒光光譜儀。它結(jié)合了牛津儀器制造的45KV微型X射線管和牛津儀器制造的大面積高分辨率硅漂移探測(cè)器（SDD），地改善了手持儀器的分析精度和測(cè)量時(shí)間。一般來(lái)說(shuō)，在相同條件下X-MAT8000比搭載Si-PIN探測(cè)器的傳統(tǒng)手持式X射線熒光儀提高了3～10倍的分析速度，同時(shí)具有更優(yōu)的檢測(cè)下限和分析精度。
新款X-MET 7500 MINING ANALYZER 采用大面積SDD檢測(cè)器，同比其他廠牌的機(jī)型有更好的LOD的精度。
**步：取樣
**步：檢測(cè)
第三步：結(jié)果
日立X-MAT8000X射線熒光光譜儀現(xiàn)已廣泛應(yīng)用在土壤/礦物領(lǐng)域
土壤/礦物成分篩選分析
土壤污染區(qū)域監(jiān)控
土壤污染源查找
陶瓷及耐火材料分析
礦區(qū)環(huán)境監(jiān)測(cè)
礦物成分分析